Semicorex provides various types of 4H and 6H SiC wafers. We have been manufacturer and supplier of silicon carbide products for many years. Our double-polished 6 Inch Semi-Insulating HPSI SiC Wafer has a good price advantage and cover most of the European and American markets. We look forward to becoming your long-term partner in China.
Semicorex has a complete silicon carbide(SiC) wafer products line, including 4H and 6H substrates with N-type, P-type and high purity semi-insulating wafers, they can be with or without epitaxy.
The 6 inch diameter of our Mechanical Grade Gallium Arsenide (GaAs) Semi-insulating Wafer at WMC provides a large surface area for manufacturing power electronic devices such as MOSFETs, Schottky diodes, and other high-voltage applications. Mechanical Grade Gallium Arsenide (GaAs) Semi-insulating Wafer at WMC is mainly used in 5G communications, radar systems, guidance heads, satellite communications, warplanes and other fields, with the advantages of enhancing the RF range, ultra-long-range identification, anti-jamming and high-speed, high-capacity information transfer applications, is considered the most ideal substrate for making microwave power devices.
Specifications:
● Diameter: 6″
●Double-polished
● Grade: Production, Research, Dummy
● 4H-SiC HPSI Wafer
● Thickness: 500±25 μm
● Micropipe Density: ≤1 ea/cm2 ~ ≤15 ea/cm2
Items |
Production |
Research |
Dummy |
Crystal Parameters |
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Polytype |
4H |
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Surface orientation on-axis |
<0001 > |
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Surface orientation off-axis |
0±0.2° |
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(0004)FWHM |
≤45arcsec |
≤60arcsec |
≤1OOarcsec |
Electrical Parameters |
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Type |
HPSI |
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Resistivity |
≥1 E8ohm·cm |
100% area > 1 E5ohm·cm |
70% area > 1 E5ohm·cm |
Mechanical Parameters |
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Diameter |
150±0.2 mm |
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Thickness |
500±25 μm |
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Primary flat orientation |
[1-100]±5° or Notch |
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Primary flat length/depth |
47.5±1.5mm or 1 - 1.25mm |
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TTV |
≤5 μm |
≤10 μm |
≤15 μm |
LTV |
≤3 μm(5mm*5mm) |
≤5 μm(5mm*5mm) |
≤10 μm(5mm*5mm) |
Bow |
-15μm ~ 15μm |
-35μm ~ 35μm |
-45μm ~ 45μm |
Warp |
≤35 μm |
≤45 μm |
≤55 μm |
Front(Si-face) roughness(AFM) |
Ra≤0.2nm (5μm*5μm) |
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Structure |
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Micropipe density |
≤1 ea/cm2 |
≤10 ea/cm2 |
≤15 ea/cm2 |
Carbon inclusion density |
≤1 ea/cm2 |
NA |
|
Hexagonal void |
None |
NA |
|
Metal impurities |
≤5E12atoms/cm2 |
NA |
|
Front Quality |
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Front |
Si |
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Surface finish |
Si-face CMP |
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Particles |
≤60ea/wafer (size≥0.3μm) |
NA |
|
Scratches |
≤5ea/mm. Cumulative length ≤Diameter |
Cumulative length≤300mm |
NA |
Orange peel/pits/stains/striations/ cracks/contamination |
None |
NA |
|
Edge chips/indents/fracture/hex plates |
None |
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Polytype areas |
None |
Cumulative area≤20% |
Cumulative area≤30% |
Front laser marking |
None |
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Back Quality |
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Back finish |
C-face CMP |
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Scratches |
≤5ea/mm,Cumulative length≤2*Diameter |
NA |
|
Back defects (edge chips/indents) |
None |
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Back roughness |
Ra≤0.2nm (5μm*5μm) |
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Back laser marking |
"SEMI" |
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Edge |
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Edge |
Chamfer |
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Packaging |
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Packaging |
Epi-ready with vacuum packaging Multi-wafer cassette packaging |
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*Notes: "NA" means no request Items not mentioned may refer to SEMI-STD. |